STB R2 is a signal integrity test board designed for high-frequency hardware engineers, RF engineers, SI/PI simulation engineers and university electronics laboratories. This board focuses on verification of advanced structures such as differential signal integrity, via layer transition effects and filter characteristics. It can independently perform mixed-mode S-parameter extraction and frequency-domain response testing, and when used together with STB R1, it covers the complete functionality of SI test boards. Applicable to high-speed differential signal integrity research (such as mixed-mode S-parameter extraction and mode conversion analysis), impedance discontinuity and TDR analysis caused by via layer transitions, frequency-domain response verification of bandpass filters and simulation vs. measurement comparison, as well as SI teaching demonstrations in university electronics labs and research on PCB manufacturing tolerance effects on high-frequency circuit performance.
PCB specs: 4-layer, FR-4 material (TG≥150℃), 1.6mm thickness Impedance design: 50Ω single-ended / 100Ω differential (controlled impedance design) Connectors: SMA female, edge-mounted, gold-plated contacts On-board features: differential pair stripline, reference layer switching stripline (via layer transition), digital bandpass filter Board dimensions: approx. 50 mm × 50 mm
